Micro prism array

Near field calculation of a micro prism array. The color scheme shows the intensity distribution, the white arrows depict the Poynting vectors.

Microstructured Surfaces

R&D Services

Our expertise in the field of microstructured surfaces serves the development of the following applications:

Radiation management for photovoltaic systems

Radiation management for displays

Photonic structures for non-optical applications

Efficient use of light in lighting applications

Examples of photonic microstructures

Methods and equipment

Microstructured surfaces are capable of performing many different functions. One important field of use is radiation management in optical systems.

In solar cells, micro or nanometer scale structures assist with capturing and making optimum use of light. In artificial lighting and daylighting elements, they help to improve light outcoupling or direct light in the desired direction, while in display applications they are used for antireflection, polarization, light control or defined scattering.

Microstructures also play a part in modifying non-optical characteristics, for instance in modifying the adhesion, wetting or coefficient of friction of surfaces. At Fraunhofer ISE we work on the modeling, design, production, replication and characterization of large-area micro and nanostructures.

Highlights

  • Client-specific structure design: variety of modeling tools employed to model the effects of both geometrical and physical optics. Knowledge of functional range and ability to combine different simulation approaches for specific applications.
  • Interference lithography: seamless production of varied, customized micro- and nanostructures on surfaces up to 1.2 x 1.2 m².
  • Replication processes: inexpensive production of micro- and nanostructures in large quantities. E.g. using roller nanoimprint lithography to pattern resist layers onto rough, rigid and opaque substrates in in-line processes.
  • Characterization of micro- and nanostructures using microscopy and optical metrology.