Berlin, Deutschland  /  8.9.2019  -  12.9.2019

International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)

The conference focuses on all aspects of defects in semiconductors including point, line, planar and volume defects studied by a variety of tools. Most recent advances in the field of defect analysis will be discussed. This comprehensive approach has allowed for a discussion of the multifaceted effects of growth, processing, device fabrication as well as their interrelationships, and how to approach the study of defects.

The conference provides an outstanding international forum to present and discuss the correlation between crystal defects, device fabrication and degradation.